CARACTERIZACIÓN ELÉCTRICA, RUIDO Y ALTA FRECUENCIA

RF DEVICES LABORATORY image002 image004

Description

The laboratory of RF devices is dedicated to the characterization of
semiconductor materials and sub-­‐micrometer devices up to microwave frequencies. 
Our tools allow performing several kinds of on­‐wafer measurements from
DC and pulsed characterization, to RF and electronic noise (up to 43.5 GHz).

Main Equipments

Cascade M150 probe station  image006
Keithley 4200‐ SCS parameter analyzer
with the ultrafast I‐V module Keithley 4225
allowing to perform pulsed
measurements with		 image008image010image012
Tektronix RSA5126A Real Time
Signal Analyzer 1 Hz-­‐26.5 GHz
(with 110 MHz acquisition BW)		  image014
VNA Agilent N5244A PNA­‐X with low noise receivers
(option 029) for RF and noise
characterization up to 43.5 GHz		  image016

CARACTERIZACIÓN ELÉCTRICA, RUIDO Y ALTA FRECUENCIA(PDF)

nanolab location