RF DEVICES LABORATORY | ![]() |
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Description
The laboratory of RF devices is dedicated to the characterization of semiconductor materials and sub-‐micrometer devices up to microwave frequencies. Our tools allow performing several kinds of on‐wafer measurements from DC and pulsed characterization, to RF and electronic noise (up to 43.5 GHz).
Main Equipments
Cascade M150 probe station | ![]() |
Keithley 4200‐ SCS parameter analyzer with the ultrafast I‐V module Keithley 4225 allowing to perform pulsed measurements with |
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Tektronix RSA5126A Real Time Signal Analyzer 1 Hz-‐26.5 GHz (with 110 MHz acquisition BW) |
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VNA Agilent N5244A PNA‐X with low noise receivers (option 029) for RF and noise characterization up to 43.5 GHz |
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CARACTERIZACIÓN ELÉCTRICA, RUIDO Y ALTA FRECUENCIA(PDF)